Search results for: Erik Lind
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 112 - 116
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2353 - 2359
IEEE Electron Device Letters > 2013 > 34 > 2 > 211 - 213
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2375 - 2382
IEEE Transactions on Electron Devices > 2008 > 55 > 11 > 3030 - 3036