Search results for: Cyril Buttay
Microelectronics Reliability > 2017 > 76-77 > C > 444-449
Microelectronics Reliability > 2017 > 76-77 > C > 362-367
Microelectronics Reliability > 2017 > 76-77 > C > 400-404
IEEE Transactions on Power Electronics > 2017 > 32 > 2 > 906 - 910
IEEE Transactions on Industry Applications > 2017 > 53 > 1 > 362 - 370
Microelectronics Reliability > 2016 > 64 > C > 494-501
Microelectronics Reliability > 2015 > 55 > 9-10 > 1708-1713
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 1 > 143 - 150