Search results for: Samuel Pagliarini
IEEE Transactions on Emerging Topics in Computing > 2017 > 5 > 2 > 260 - 270
IEEE Transactions on Reliability > 2017 > 66 > 1 > 233 - 244
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2768 - 2775
Journal of Electronic Testing > 2011 > 27 > 4 > 541-550