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The quality level of mixed-signal ICs lags behind the below-part-per-million defect test escape rates of digital ICs, as a result of the traditional testing based on performance specifications. Methods increasing the controllability to solve the problem of the low fault coverage of analog and mixed-signal circuits are in practice limited due to the excessive area overhead they require and their impact...
In this paper a method is presented to address the automatic testing of analog ICs. Based on Design-for-Testability building blocks offering extra controllability and extra observability, a test infrastructure is generated for a targeted circuit. The selection of the extra blocks and their insertion into the circuit is done automaticaly by a proposed optimization algorithm. Adopting a defect-oriented...
A general method is proposed to automatically generate a DfT solution aiming at the detection of catastrophic faults in analog and mixed-signal integrated circuits. The approach consists in modifying the topology of the circuit by pulling up (down) nodes and then probing differentiating node voltages. The method generates a set of optimal hardware implementations addressing the multi-objective problem...
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