Search results for: R Degraeve
Microelectronic Engineering > 2017 > 178 > C > 93-97
Microelectronic Engineering > 2017 > 178 > C > 38-41
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-1.1 - 5A-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-1.1 - 4C-1.7
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
2016 IEEE International Electron Devices Meeting (IEDM) > 4.6.1 - 4.6.4
Solid-State Electronics > 2016 > 125 > C > 52-62
Solid-State Electronics > 2016 > 125 > C > 198-203
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-4-1 - 6C-4-5
2016 IEEE International Reliability Physics Symposium (IRPS) > IT-2-1 - IT-2-5
2015 IEEE International Electron Devices Meeting (IEDM) > 5.6.1 - 5.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 10.6.1 - 10.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
2015 IEEE International Electron Devices Meeting (IEDM) > 3.1.1 - 3.1.4
Microelectronic Engineering > 2015 > 147 > C > 45-50
Microelectronic Engineering > 2015 > 147 > C > 171-175