Search results for: S Capraro
Journal of Electronic Testing > 2019 > 35 > 2 > 245-252
Microelectronics Reliability > 2017 > 72 > C > 30-33
Electronics Letters > 2016 > 52 > 12 > 1050 - 1052
Microsystem Technologies > 2017 > 23 > 9 > 3827-3833
Analog Integrated Circuits and Signal Processing > 2016 > 88 > 1 > 105-113
Microelectronic Engineering > 2011 > 88 > 5 > 564-568
Microelectronic Engineering > 2011 > 88 > 5 > 729-733
Microelectronic Engineering > 2011 > 88 > 5 > 734-738
Electronics Letters > 2008 > 44 > 6 > 411 - 412