Search results for: Jiahao Kang
SID Symposium Digest of Technical Papers > 54 > 1 > 510 - 513
SID Symposium Digest of Technical Papers > 52 > 1 > 1056 - 1059
SID Symposium Digest of Technical Papers > 51 > 1 > 1871 - 1874
SID Symposium Digest of Technical Papers > 51 > 1 > 1326 - 1329
SID Symposium Digest of Technical Papers > 51 > 1 > 1040 - 1043
SID Symposium Digest of Technical Papers > 51 > 1 > 351 - 354
SID Symposium Digest of Technical Papers > 50 > 1 > 1759 - 1762
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-1.1 - 6B-1.6
2016 IEEE International Electron Devices Meeting (IEDM) > 30.3.1 - 30.3.4
IEEE Electron Device Letters > 2016 > 37 > 11 > 1497 - 1500
IEEE Electron Device Letters > 2016 > 37 > 9 > 1246 - 1249
2015 IEEE International Electron Devices Meeting (IEDM) > 12.3.1 - 12.3.4
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3459 - 3469
2014 IEEE International Electron Devices Meeting > 5.4.1 - 5.4.4
2014 IEEE International Electron Devices Meeting > 30.5.1 - 30.5.4
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4282 - 4290
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3456 - 3464
2013 IEEE International Electron Devices Meeting > 19.4.1 - 19.4.4
2013 IEEE International Electron Devices Meeting > 19.1.1 - 19.1.4