Search results for: C.D. Young
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1322 - 1329
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1322 - 1329
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131