Search results for: Yue-Ming Hsin
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 835 - 839
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 726 - 731
IEEE Electron Device Letters > 2012 > 33 > 7 > 964 - 966
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 835 - 839
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 726 - 731
IEEE Electron Device Letters > 2012 > 33 > 7 > 964 - 966