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Current amplitudes of a cable discharge event (CDE) are a risk for electronic interfaces if a cable can discharge directly into a signal pin. CDE have been recorded for several cables in different configurations. CDE can be modeled by square pulses, thus, Transmission Line Pulsing is a good approach for characterizing interface pins and protection elements.
The partitioned HBM test is a new method to test complex devices with a high number of domains. By splitting the test into well defined sections overstress due to multi-zapping is reduced. All design relevant failures are addressed and only non-instructional multi-zapping induced failures are avoided. Furthermore the clear structure of the applied stress allows finding the root cause of the failures...
The present work is focussed on the trade off between conventional RF ESD protection concepts optimized in terms of capacitive load and the frequently discussed RF ESD codesign idea with ESD protection skilfully integrated into RF circuit design. A narrow and a broadband RF test circuit were developed to put the benchmark on a firm basis. RF and ESD experiments are discussed, showing where the higher...
Trigger dynamics during a single ESD event and pulse-to-pulse variations in the trigger location are studied in ESD protection devices of a smart power technology. NPN bipolar transistors with and without a lateral shift in the collector buried layer are investigated. The homogeneity of the current flow along the device width is studied by means of a laser interferometric thermal mapping technique...
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