Search results for: M.A. Alam
IEEE Electron Device Letters > 2009 > 30 > 9 > 972 - 974
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 35 - 46
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3421 - 3431
IEEE Electron Device Letters > 2009 > 30 > 9 > 972 - 974
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 35 - 46
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3421 - 3431