Search results for: M.. Kuball
Acta Materialia > 2017 > 139 > C > 215-225
Microelectronics Reliability > 2017 > 68 > C > 2-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-4-1 - 4A-4-5
2015 IEEE International Electron Devices Meeting (IEDM) > 35.2.1 - 35.2.4
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2505-2510
Microwave and Optical Technology Letters > 56 > 11 > 2699 - 2700
physica status solidi c > 11 > 3‐4 > 871 - 874
IEEE Electron Device Letters > 2013 > 34 > 1 > 39 - 41