Search results for: D.S. Ang
Microelectronics Reliability > 2014 > 54 > 4 > 663-681
Microelectronic Engineering > 2011 > 88 > 7 > 1392-1395
2009 IEEE International Reliability Physics Symposium > 1019 - 1022
2009 IEEE International Reliability Physics Symposium > 1002 - 1004
IEEE Electron Device Letters > 2009 > 30 > 7 > 751 - 753
IEEE Electron Device Letters > 2009 > 30 > 7 > 772 - 774
IEEE Electron Device Letters > 2009 > 30 > 3 > 275 - 277
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 22 - 34
IEEE Electron Device Letters > 2008 > 29 > 8 > 934 - 937
Microelectronic Engineering > 2007 > 84 > 9-10 > 1929-1933