Search results for: M. Caymax
Journal of Microscopy > 268 > 3 > 276 - 287
physica status solidi c > 13 > 10‐12 > 718 - 723
Journal of Crystal Growth > 2016 > 452 > C > 244-247
Thin Solid Films > 2015 > 590 > C > 163-169
2014 IEEE International Reliability Physics Symposium > PI.2.1 - PI.2.5
Journal of Crystal Growth > 2014 > 391 > Complete > 59-63
Microelectronic Engineering > 2013 > 109 > Complete > 46-49
2012 International Electron Devices Meeting > 28.3.1 - 28.3.4
2012 International Electron Devices Meeting > 16.2.1 - 16.2.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
Materials Science in Semiconductor Processing > 2012 > 15 > 6 > 588-600
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
Thin Solid Films > 2012 > 520 > 8 > 3245-3248
Thin Solid Films > 2012 > 520 > 8 > 3206-3210