Search results for: B. Meyler
Microelectronics Reliability > 2017 > 79 > C > 265-269
IEEE Electron Device Letters > 2012 > 33 > 1 > 11 - 13
Microelectronic Engineering > 2011 > 88 > 6 > 964-968
Journal of Electronic Materials > 2006 > 35 > 12 > L15-L19
Microelectronics Reliability > 2005 > 45 > 5-6 > 933-936
Journal of Crystal Growth > 2002 > 243 > 3-4 > 375-380
Journal of Crystal Growth > 2001 > 230 > 3-4 > 341-345
Materials Science & Engineering A > 2001 > 302 > 1 > 14 - 17
Journal of Crystal Growth > 2000 > 218 > 2-4 > 181-190
Solid State Electronics > 1996 > 39 > 10 > 1457-1462