Search results for: W. Vandervorst
IEEE Electron Device Letters > 2008 > 29 > 1 > 34 - 37
2007 IEEE International Electron Devices Meeting > 955 - 958
Solid State Electronics > 2007 > 51 > 11-12 > 1432-1436
Nuclear Inst. and Methods in Physics Research, B > 2007 > 261 > 1-2 > 529-533
Nuclear Inst. and Methods in Physics Research, B > 2007 > 261 > 1-2 > 512-515
Microelectronic Engineering > 2007 > 84 > 5-8 > 1162-1167
Microelectronic Engineering > 2007 > 84 > 3 > 495-500
Surface Science > 2007 > 601 > 3 > 763-771
Nuclear Inst. and Methods in Physics Research, B > 2006 > 253 > 1-2 > 136-140
Nuclear Inst. and Methods in Physics Research, B > 2006 > 249 > 1-2 > 292-296
Materials Science in Semiconductor Processing > 2006 > 9 > 4-5 > 634-639
Nuclear Inst. and Methods in Physics Research, B > 2006 > 249 > 1-2 > 189-192
Materials Science in Semiconductor Processing > 2006 > 9 > 4-5 > 679-684
Nuclear Inst. and Methods in Physics Research, B > 2006 > 249 > 1-2 > 847-850
Applied Surface Science > 2006 > 252 > 19 > 7239-7242
Thin Solid Films > 2006 > 508 > 1-2 > 292-296
Thin Solid Films > 2006 > 508 > 1-2 > 1-5