Wyniki wyszukiwania dla: W. Vandervorst
Journal of Microscopy > 268 > 3 > 276 - 287
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 406 > PA > 25-29
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 406 > PA > 66-70
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2017 > 406 > PA > 115-118
Ultramicroscopy > 2017 > 179 > C > 100-107
Ultramicroscopy > 2017 > 177 > C > 58-68
Materials Science in Semiconductor Processing > 2017 > 62 > C > 31-48
Engineering Materials and Processes > Materials for Information Technology > Advanced Materials Characterization > 437-447
Microelectronic Engineering > 2016 > 159 > C > 46-50
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2016 > 371 > C > 153-155
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Physics of Modern SemOI Devices > 141-153
Ultramicroscopy > 2016 > 161 > C > 59-65
2015 IEEE International Electron Devices Meeting (IEDM) > 21.8.1 - 21.8.4
physica status solidi (a) > 212 > 11 > 2578 - 2582
Thin Solid Films > 2015 > 590 > C > 163-169
Thin Solid Films > 2015 > 589 > C > 315-321
IEEE Electron Device Letters > 2015 > 36 > 8 > 775 - 777
Microelectronic Engineering > 2015 > 141 > C > 1-5