Search results for: W. Mertin
Ultramicroscopy > 2005 > 105 > 1-4 > 228-232
Microelectronics Reliability > 2005 > 45 > 9-11 > 1505-1508
Microelectronics Reliability > 2000 > 40 > 8-10 > 1401-1406
Microelectronics Reliability > 2000 > 40 > 8-10 > 1389-1394
Microelectronics Reliability > 1999 > 39 > 6-7 > 975-980
Microelectronics Reliability > 1999 > 39 > 6-7 > 951-956
Microelectronics Reliability > 1999 > 39 > 6-7 > 969-974
Microelectronics Reliability > 1998 > 38 > 6-8 > 969-974
Microelectronics Reliability > 1998 > 38 > 6-8 > 981-986
Ultramicroscopy > 1998 > 71 > 1-4 > 99-105
Microelectronic Engineering > 1996 > 31 > 1-4 > 365-376
01993 00023rd European Microwave Conference > 1993 > 497 - 499
1993 IEEE MTT-S International Microwave Symposium Digest > 1351 - 1354 vol.3