The aim of this paper is to present a new test method for contactless quantitative current measurements via scanning magneto-resistive probe microscopy. Its basic principle is based on the detection of the magnetic field over a current-carrying conducting line by a magneto-resistive probe, which is fastened to a scanning force microscope (SFM). The function and efficiency of this method is demonstrated by measuring the current flow through a conducting line with hundred kilohertz bandwidth. Regarding to the function and failure analysis of integrated circuits the size of the magneto-resistive probe is reduced, and the obtained experimental results are discussed.