Search results for: K. Kohmura
Microelectronic Engineering > 2011 > 88 > 5 > 666-670
2011 International Reliability Physics Symposium > 2F.1.1 - 2F.1.4
2007 IEEE International Electron Devices Meeting > 969 - 972
Thin Solid Films > 2007 > 515 > 12 > 5019-5024
Microelectronic Engineering > 2006 > 83 > 11-12 > 2142-2145
Microelectronic Engineering > 2006 > 83 > 11-12 > 2126-2129
Journal of Nuclear Materials > 1996 > 233-237 > 2001 > 492-496