Search results for: Biwei Liu
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 119 - 124
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 410 - 416
Science China Information Sciences > 2015 > 58 > 2 > 1-9
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 268 - 274
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 139 - 145
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 849 - 856
IEEE Transactions on Nuclear Science > 2014 > 61 > 1-3 > 646 - 653
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 177 - 184
Science China Technological Sciences > 2013 > 56 > 2 > 271-279
Microelectronics Reliability > 2012 > 52 > 6 > 1227-1232
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 501 - 509
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2859 - 2866
Science China Technological Sciences > 2012 > 55 > 3 > 665-672
Science China Technological Sciences > 2012 > 55 > 4 > 1001-1006
Science China Information Sciences > 2012 > 55 > 6 > 1461-1468
Science China Technological Sciences > 2011 > 54 > 11 > 3064-3069
Science China Physics, Mechanics & Astronomy > 2011 > 54 > 2 > 268-272
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-3 > 2473 - 2479