Search results for: P. Godignon
Microelectronics Reliability > 2016 > 64 > C > 429-433
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Novel SOI Devices and Sensors Operating at Harsh Conditions > 279-284
Microelectronics Reliability > 2015 > 55 > 9-10 > 1542-1548
Microelectronics Reliability > 2014 > 54 > 9-10 > 2207-2212
Microelectronics Reliability > 2014 > 54 > 9-10 > 2217-2221
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1732 - 1738
CAS 2012 (International Semiconductor Conference) > 2 > 359 - 362