Search results for: M. Van Hove
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-5-1 - CD-5-4
2015 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
Solid State Electronics > 2015 > 113 > Complete > 9-14
Microelectronics Reliability > 2015 > 55 > 9-10 > 1692-1696
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.7
IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 3 > 361 - 367
2011 International Electron Devices Meeting > 19.6.1 - 19.6.4
Microelectronics Reliability > 2011 > 51 > 9-11 > 1717-1720
EOS/ESD Symposium Proceedings > 1 - 8
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4
IEEE Transactions on Electron Devices > 2010 > 57 > 12 > 3333 - 3339
IEEE Electron Device Letters > 2010 > 31 > 9 > 948 - 950
IEEE Electron Device Letters > 2010 > 31 > 2 > 111 - 113
Microelectronic Engineering > 2007 > 84 > 11 > 2582-2586
Microelectronic Engineering > 2006 > 83 > 11-12 > 2303-2308