Search results for: Wei Yao
IEEE Solid-State Circuits Magazine > 2014 > 6 > 2 > 35 - 46
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 81 - 86
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 4 > 746 - 750
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1863 - 1869
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 542 - 550