Search results for: Kin-Leong Pey
Materials Science in Semiconductor Processing > 2017 > 66 > C > 191-199
physica status solidi (a) > 213 > 7 > 1807 - 1813
Microelectronics Reliability > 2016 > 61 > C > 71-77
Microelectronics Reliability > 2015 > 55 > 9-10 > 1412-1416
Microelectronics Reliability > 2015 > 55 > 9-10 > 1422-1426
Microelectronics Reliability > 2014 > 54 > 9-10 > 1666-1670
Microelectronics Reliability > 2014 > 54 > 9-10 > 2295-2299
Microelectronics Reliability > 2014 > 54 > 9-10 > 2266-2271
Microelectronics Reliability > 2014 > 54 > 9-10 > 1729-1734
2014 IEEE International Reliability Physics Symposium > 5B.4.1 - 5B.4.7
2014 IEEE International Reliability Physics Symposium > MY.9.1 - MY.9.7
Thin Solid Films > 2014 > 558 > C > 356-364
Microelectronics Reliability > 2014 > 54 > 5 > 847-860
IEEE Electron Device Letters > 2014 > 35 > 2 > 157 - 159
Microelectronic Engineering > 2013 > 109 > Complete > 364-369
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.3.1 - 3E.3.7