Search results for: Xiao Yu
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 434 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 909 - 915
2015 IEEE International Electron Devices Meeting (IEDM) > 2.2.1 - 2.2.4