Search results for: E. Zanoni
Microelectronics Reliability > 1998 > 38 > 6-8 > 1227-1232
Microelectronics Reliability > 1997 > 37 > 10-11 > 1561-1564
Microelectronics Reliability > 1997 > 37 > 10-11 > 1679-1682
Solid State Electronics > 1997 > 41 > 7 > 935-938
Microelectronics Reliability > 1996 > 36 > 11-12 > 1895-1898
Microelectronics Reliability > 1996 > 36 > 7-8 > 1033-1044
Electronics Letters > 1993 > 29 > 10 > 931 - 933
29th International Reliability Physics Symposium > 206 - 213