Search results for: E. Zanoni
Microelectronics Reliability > 2018 > 80 > C > 257-265
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3734 - 3739
Microelectronics Reliability > 2017 > 76-77 > C > 556-560
Microelectronics Reliability > 2017 > 76-77 > C > 298-303
Microelectronics Reliability > 2017 > 76-77 > C > 584-587
Microelectronics Reliability > 2017 > 76-77 > C > 575-578
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3126 - 3131
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
Microelectronics Reliability > 2016 > 64 > C > 623-626
Microelectronics Reliability > 2016 > 64 > C > 535-540
Microelectronics Reliability > 2016 > 64 > C > 610-613
Microelectronics Reliability > 2016 > 58 > C > 177-184
2015 IEEE International Electron Devices Meeting (IEDM) > 35.2.1 - 35.2.4
Solid State Electronics > 2015 > 113 > Complete > 49-53
Solid State Electronics > 2015 > 113 > Complete > 15-21