Search results for: G. Talut
ISIAME 2008 > 425-432
Microelectronics Reliability > 2014 > 54 > 9-10 > 1671-1674
2013 IEEE International Reliability Physics Symposium (IRPS) > 2C.1.1 - 2C.1.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.1.1 - 2F.1.5
Acta Materialia > 2012 > 60 > 10 > 4065-4076
Journal of Magnetism and Magnetic Materials > 2011 > 323 > 11 > 1551-1562
Journal of Nuclear Materials > 2011 > 412 > 3 > 350-358
Vacuum > 2009 > 83 > Supplement 1 > S13-S19
Hyperfine Interactions > 2009 > 191 > 1-3 > 95-102