Search results for: C. Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-9.1 - XT-9.5
Journal of Microscopy > 260 > 3 > 389 - 399
2015 IEEE International Reliability Physics Symposium > 3B.1.1 - 3B.1.6
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3111 - 3117
IEEE Journal of Solid-State Circuits > 2014 > 49 > 12 > 2891 - 2901
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2215 - 2220
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 458 - 460
IEEE Journal of Solid-State Circuits > 2011 > 46 > 4 > 870 - 882
IEEE Electron Device Letters > 2011 > 32 > 6 > 734 - 736
TENCON 2010 - 2010 IEEE Region 10 Conference > 2072 - 2076