Search results for: G. Ghidini
Microelectronics Reliability > 2007 > 47 > 9-11 > 1384-1388
Microelectronics Reliability > 2007 > 47 > 9-11 > 1349-1352
Microelectronics Reliability > 2007 > 47 > 4-5 > 598-601
IEEE Electron Device Letters > 2007 > 28 > 12 > 1114 - 1116
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1898 - 1905
Microelectronics Reliability > 2006 > 46 > 9-11 > 1669-1672
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1917 - 1922
Microelectronics Reliability > 2005 > 45 > 9-11 > 1337-1342
Microelectronic Engineering > 2005 > 80 > Complete > 178-181
Microelectronics Reliability > 2005 > 45 > 5-6 > 875-878
Microelectronics Reliability > 2005 > 45 > 5-6 > 857-860
Microelectronic Engineering > 2004 > 72 > 1-4 > 66-70
Microelectronic Engineering > 2004 > 72 > 1-4 > 5-9
Microelectronics Reliability > 2003 > 43 > 8 > 1247-1251
Microelectronics Reliability > 2003 > 43 > 8 > 1229-1235
Microelectronics Reliability > 2003 > 43 > 8 > 1221-1227