Search results for: M. A. Alam
2016 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
IEEE Electron Device Letters > 2016 > 37 > 6 > 801 - 804
2014 IEEE International Electron Devices Meeting > 20.3.1 - 20.3.4
2014 IEEE International Electron Devices Meeting > 20.1.1 - 20.1.4
2013 IEEE International Electron Devices Meeting > 7.5.1 - 7.5.4
2012 IEEE International Reliability Physics Symposium (IRPS) > ME.1.1 - ME.1.7
2011 International Reliability Physics Symposium > 6A.3.1 - 6A.3.10
2011 International Reliability Physics Symposium > 3A.3.1 - 3A.3.6
2011 International Reliability Physics Symposium > 5E.4.1 - 5E.4.5
IEEE Transactions on Nanotechnology > 2011 > 10 > 3 > 439 - 444
2010 International Electron Devices Meeting > 8.7.1 - 8.7.4
2010 IEEE International Reliability Physics Symposium > 1069 - 1072