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This paper presents a systematic methodology to characterize and model on-chip inductors, built over a ground shield, directly from S-parameter measurements. Excellent model-experiment correlation is achieved up to 50 GHz for the circuit network parameters as well as for the Q-factor.
In this paper, the extraction of the relative permittivity from transmission line measurements by neglecting and considering the metal losses is performed. It is observed that the extracted permittivity obtained in both cases allows to achieve good model-experiment correlation for S-parameters. However, when performing time-domain simulations, if the contribution of the metal losses on the phase delay...
This paper presents a model for the parasitic series resistance and inductance of pads used to on-wafer probing of microstrip-line-fed devices. The model accounts for the frequency-dependent current distribution and skin effects, as well as for the geometry of the pad array, which allows to obtain the series parasitics without the need of measuring a “short” dummy structure. Accordingly, these closed-form...
An analysis of the level of hot carrier (HC) degradation caused in sub-100 nm n-type MOSFETs operated from DC up to 20 GHz, is introduced. The analysis comes accompanied with experimental results. The degradation process is done through the application of controlled DC currents at well defines periods of time. The recorded S-parameters before and after DC degradation allows the observation of the...
This paper presents a systematic methodology for characterizing and modeling on-chip inductors over a lossy substrate directly from S-parameter measurements. The model implementation neither requires precise knowledge of geometry or fabrication process. This eases the representation of inductors in SPICE-like simulators at high frequencies. Excellent model-experiment correlation is achieved up to...
A complete methodology to characterize substrate integrated waveguide (SIW) structures from S-parameter measurements is presented. We determined the complex propagation constant, the characteristic impedance of a homogeneous section of waveguide, and the efficiency of different adapters used to launch the signals into the waveguide. After a detailed analysis, it is observed that the most significant...
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