Search results for: J. Wang
Microelectronic Engineering > 2016 > 163 > C > 78-82
Microelectronics Reliability > 2014 > 54 > 9-10 > 2053-2057
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.3.1 - GD.3.4
2012 IEEE International Reliability Physics Symposium (IRPS) > BD.5.1 - BD.5.4
International Journal of Fatigue > 2009 > 31 > 5 > 799-808