Search results for: F.L. Sun
Microelectronics Reliability > 2015 > 55 > 11 > 2391-2395
Microelectronics Reliability > 2014 > 54 > 9-10 > 2053-2057
Materials Characterization > 2010 > 61 > 5 > 542-547
Microelectronics Reliability > 2009 > 49 > 9-11 > 1299-1303
Surface Science > 2002 > 512 > 3 > L379-L384