Search results for: Li Wu
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-2-1 - 4A-2-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Electron Device Letters > 2015 > 36 > 10 > 1001 - 1003
2015 IEEE International Reliability Physics Symposium > 6C.4.1 - 6C.4.6
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.7
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141