Search results for: Li Wu
Process Safety Progress > 42 > 1 > 38 - 47
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3132 - 3141
Biochemical and Biophysical Research Communications > 2011 > 406 > 3 > 430-434
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2736 - 2743
2010 International SoC Design Conference > 13 - 16