Search results for: H. Lee
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 352 - 355
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
2016 IEEE International Electron Devices Meeting (IEDM) > 21.5.1 - 21.5.4
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-1 > 448 - 452
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-1 > 539 - 542
IEEE Transactions on Magnetics > 2015 > 51 > 11 > 1 - 4
2015 IEEE International Reliability Physics Symposium > 2F.6.1 - 2F.6.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2012 International Electron Devices Meeting > 23.5.1 - 23.5.4
IEEE Transactions on Magnetics > 2011 > 47 > 10 > 3995 - 3998