Search results for: Huang-Kuang Kung
Microelectronics Reliability > 2017 > 78 > C > 272-279
Optical and Quantum Electronics > 2017 > 49 > 8 > 1-15
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 2 > 168 - 175
Microelectronics Reliability > 2013 > 53 > 2 > 288-296
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2013 > 3 > 1 > 157 - 167
Composites Part B > 2008 > 39 > 7-8 > 1142-1146
Microelectronic Engineering > 2008 > 85 > 9 > 1902-1909
International Journal of Solids and Structures > 2008 > 45 > 11-12 > 3192-3202
Microelectronics Reliability > 2007 > 47 > 7 > 1103-1112
Microelectronic Engineering > 2006 > 83 > 10 > 1931-1939
Microelectronic Engineering > 2006 > 83 > 2 > 197-205
International Journal of Mechanical Sciences > 2005 > 47 > 2 > 170-186