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In this paper, we propose a test method for detecting pin opens of CMOS logic ICs in assembled PCBs. The test method is based on supply current of a circuit under test which flows when a time-varying signal is provided to a targeted pin with a test probe as a stimulus. Test signal's amplitude is less than VDD. Test vector generations are not needed for the tests. In the test, the test probe also can...
A built-in sensor is proposed for detecting open faults in a 3D IC by means of appearance time of dynamic supply current. It is shown by Spice simulation that they can be detected with the sensor.
In this paper, a built-in test circuit is proposed to detect open defects that occur at interconnects between dies inside 3D ICs. An inverter gate is used in the test circuit as an open sensor. Open defects are detected by means of supply current of the inverter gate flowing when an AC voltage signal is provided to targeted interconnects as a stimulus. The interconnect at which an open defect occurs...
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