Search results for: J. Lin
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 468 - 474
2017 IEEE International Reliability Physics Symposium (IRPS) > 4A-6.1 - 4A-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 3A-5.1 - 3A-5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 34.5.1 - 34.5.4
IEEE Transactions on Power Delivery > 2016 > 31 > 6 > 2538 - 2545
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 7 > 1 - 4
2016 Resilience Week (RWS) > 208 - 213
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-3-1 - CR-3-4
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1020 - 1026