Search results for: Y. Liu
IEEE Electron Device Letters > 2016 > 37 > 9 > 1193 - 1196
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-8-1 - DI-8-5
IEEE Electron Device Letters > 2011 > 32 > 5 > 605 - 607
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2072 - 2080
IEEE Electron Device Letters > 2009 > 30 > 7 > 757 - 759