Search results for: S. Philip
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4928 - 4936
Journal of Electroceramics > 2017 > 39 > 1-4 > 21-38
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1884 - 1892
IEEE Electron Device Letters > 2016 > 37 > 8 > 978 - 981
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3160 - 3167
IEEE Electron Device Letters > 2015 > 36 > 10 > 1018 - 1020
IEEE Electron Device Letters > 2015 > 36 > 1 > 29 - 31
2014 IEEE International Reliability Physics Symposium > MY.3.1 - MY.3.4
IEEE Electron Device Letters > 2014 > 35 > 9 > 912 - 914
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1377 - 1381
IEEE Electron Device Letters > 2013 > 34 > 8 > 1005 - 1007
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1183 - 1188
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3933 - 3939
IEEE Electron Device Letters > 2010 > 31 > 12 > 1449 - 1451