Search results for: Matthias Goldbach
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4199 - 4205
Microelectronics Reliability > 2011 > 51 > 12 > 2081-2085
Solid State Electronics > 2011 > 65-66 > Complete > 170-176
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4199 - 4205
Microelectronics Reliability > 2011 > 51 > 12 > 2081-2085
Solid State Electronics > 2011 > 65-66 > Complete > 170-176