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Spectral testing and linearity testing are two important categories in ADC testing. The sampling clock quality is a crucial factor in ADC spectral testing. The cumulative clock jitter of the sampling clock generates power leakage in the fundamental component of the ADC output spectrum, and the random clock jitter increases the noise floor of the ADC output spectrum, which corrupts the spectrum result...
High resolution ADCs employing histogram test for linearity measurement suffer from high test time. This test time is an important factor in determining the overall cost of the ADC. While alternate test methods for linearity checks in the presence of static errors have been proposed, no low cost test method for the detection of dynamic errors has been reported so far. This paper analyzes dynamic errors...
A low power, high speed (480Mbps) envelope detector for serial data systems such as USB2.0 is presented in this paper. The proposed architecture is based on a high frequency rectifier implementation along with a comparator and offers about 50% power and area saving compared to prior implementations using multiple comparators. A calibration scheme to make the envelope detector process, voltage and...
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