Search results for: Ken Takeuchi
Proceedings of the IEEE > 2017 > 105 > 9 > 1812 - 1821
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-6.1 - PM-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-12.1 - PM-12.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 510 - 519
IEEE Transactions on Consumer Electronics > 2016 > 62 > 3 > 267 - 274
Solid-State Electronics > 2016 > 121 > C > 25-33
IEEE Journal of Solid-State Circuits > 2016 > 51 > 4 > 1041 - 1050
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-6-1 - MY-6-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-5-1 - 6C-5-6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 1 > 115 - 128
Solid-State Electronics > 2015 > 111 > C > 129-140
2015 International 3D Systems Integration Conference (3DIC) > TS6.2.1 - TS6.2.5
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 3 > 844 - 853
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 3 > 771 - 780
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 2 > 188 - 193
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 1 > 120 - 129
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2208 - 2219