Search results for: D. M. Fleetwood
2011 International Reliability Physics Symposium > 4E.4.1 - 4E.4.4
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1499 - 1507
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2876 - 2882
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2918 - 2924
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2930 - 2936
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1933 - 1939
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3288 - 3292
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3060 - 3065
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3054 - 3059
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3298 - 3304
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3649 - 3654
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3636 - 3643
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3644 - 3648