Search results for: Z. Khatir
Journal of Computational Electronics > 2018 > 17 > 3 > 1220-1228
Applied Thermal Engineering > 2016 > 106 > C > 1337-1344
Microelectronics Reliability > 2016 > 58 > C > 204-210
Microelectronics Reliability > 2015 > 55 > 3-4 > 547-551
Microelectronics Reliability > 2014 > 54 > 9-10 > 1921-1926
Microelectronics Reliability > 2014 > 54 > 9-10 > 1770-1773
Microelectronics Reliability > 2013 > 53 > 9-11 > 1735-1738
Microelectronics Reliability > 2013 > 53 > 9-11 > 1703-1706
Microelectronics Reliability > 2013 > 53 > 9-11 > 1725-1729
IEEE Transactions on Power Electronics > 2013 > 28 > 2 > 621 - 624
Microelectronics Reliability > 2012 > 52 > 9-10 > 1859-1864
IEEE Electron Device Letters > 2012 > 33 > 4 > 576 - 578
Microelectronics Reliability > 2011 > 51 > 9-11 > 1830-1835