Search results for: J. Swerts
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-1.1 - 5A-1.5
Journal of Nonverbal Behavior > 2017 > 41 > 1 > 67-82
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-4-1 - MY-4-4
2015 IEEE International Electron Devices Meeting (IEDM) > 32.5.1 - 32.5.4
Microelectronic Engineering > 2015 > 147 > C > 108-112
Microelectronic Engineering > 2015 > 147 > C > 126-129
2015 IEEE International Reliability Physics Symposium > MY.4.1 - MY.4.6
2014 IEEE International Electron Devices Meeting > 19.1.1 - 19.1.4
2013 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4
Microelectronic Engineering > 2013 > 112 > Complete > 92-96
Microelectronic Engineering > 2013 > 106 > Complete > 81-84
IEEE Electron Device Letters > 2013 > 34 > 3 > 402 - 404
IEEE Electron Device Letters > 2012 > 33 > 4 > 483 - 485
Solid State Electronics > 2011 > 65-66 > Complete > 177-183
Sensors & Actuators: B. Chemical > 2011 > 156 > 1 > 276-282