Search results for: Nor Hisham B. Hamid
IEEE Sensors Journal > 2017 > 17 > 11 > 3398 - 3405
Microelectronics Reliability > 2016 > 63 > C > 82-89
Microelectronics Reliability > 2016 > 57 > C > 64-70
IEEE Sensors Journal > 2017 > 17 > 11 > 3398 - 3405
Microelectronics Reliability > 2016 > 63 > C > 82-89
Microelectronics Reliability > 2016 > 57 > C > 64-70